Selective oxidation process

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Recessed oxide by localized oxidation

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438443, 438452, H01L 2176

Patent

active

059239948

ABSTRACT:
A selective oxidation process includes conducting a former phase of an oxidation process employing a thick mask layer to produce an oxide layer having a thickness less than the finished thickness of a desired semiconductor device isolation insulator. Then the thickness of the mask layer is reduced and a latter phase of the oxidation process using the reducing thickness mask layer is performed to produce the desired semiconductor device isolation insulator having the ultimate thickness. The use of both a thick mask layer and a reduced thickness mask layer for various phases of the oxidation process limits both the growth of the bird's beak and the growth of crystalline defects in the bird's beak.

REFERENCES:
patent: 4968641 (1990-11-01), Kalnitsky et al.
patent: 5128274 (1992-07-01), Yabu et al.
patent: 5151381 (1992-09-01), Liu et al.
patent: 5328866 (1994-07-01), Chang et al.
patent: 5468675 (1995-11-01), Kaigawa
patent: 5519244 (1996-05-01), Yatsuda et al.
patent: 5567645 (1996-10-01), Ahn et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Selective oxidation process does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Selective oxidation process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Selective oxidation process will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2287604

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.