Selective etching method of polyimide type resin film

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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Details

156668, 156904, 252 791, 430313, 430317, B44C 122, C03C 1500, C03C 2506, B29C 1708

Patent

active

044365837

ABSTRACT:
Disclosed is a selective etching method of a polyimide type resin film which uses an etching mask consisting of a negative type photoresist material prepared by adding a photosensitive reagent to an unsaturated ketone polymer such as polymethylisopropenylketone as the base resin and an etching solution consisting of 20 to 40% by volume of hydrazine hydrate and the balance of a polyamine. The etching method of the present invention can provide the pattern of the polyimide type resin film having high dimensional accuracy by wet etching.

REFERENCES:
patent: 3833436 (1974-09-01), Hillis et al.

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