Segmented column virtual ground scheme in a static random...

Static information storage and retrieval – Systems using particular element – Flip-flop

Reexamination Certificate

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C365S156000

Reexamination Certificate

active

07372721

ABSTRACT:
A static random access memory (SRAM) cell array is provided that reduces leakage current. The SRAM cell array is configured in a plurality of columns. Each of the columns comprises: a column virtual ground node; a column switch for selectively coupling the column virtual ground node to one of a ground or a nominal low voltage; and a plurality of segments. Each of the segments comprises: a segment virtual ground node; a plurality of SRAM cells including a virtual ground signal coupled to the segment virtual ground node; and a virtual ground switch for selectively coupling the segment virtual ground node to one of either a nominal low voltage or the column virtual ground node. A method for operating the SRAM cell array is also described.

REFERENCES:
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patent: 6977519 (2005-12-01), Bhavnagarwala et al.
patent: 7259986 (2007-08-01), Bhavnagarwala et al.
patent: 7307899 (2007-12-01), Khellah et al.
patent: 2005/0018474 (2005-01-01), Sohn
patent: 2005/0157537 (2005-07-01), Wei et al.
PCT International Search Report and Written Opinion dated Feb. 19, 2007 for corresponding PCT Application No. PCT/CA2006/001741.

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