Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2006-10-25
2008-05-13
Le, Vu A. (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S156000
Reexamination Certificate
active
07372721
ABSTRACT:
A static random access memory (SRAM) cell array is provided that reduces leakage current. The SRAM cell array is configured in a plurality of columns. Each of the columns comprises: a column virtual ground node; a column switch for selectively coupling the column virtual ground node to one of a ground or a nominal low voltage; and a plurality of segments. Each of the segments comprises: a segment virtual ground node; a plurality of SRAM cells including a virtual ground signal coupled to the segment virtual ground node; and a virtual ground switch for selectively coupling the segment virtual ground node to one of either a nominal low voltage or the column virtual ground node. A method for operating the SRAM cell array is also described.
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Sachdev Manoj
Sharifkhani Mohammad
Gowling Lafleur Henderson LLP
Le Vu A.
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