Sector shift read corruption detection

Details Sector shift read corruption detection Sector shift read corruption detection

2007-11-21

2010-11-23

Beausoliel, Robert (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S005110, C714S030000

Reexamination Certificate

active

07840847

ABSTRACT:
A method and system are disclosed to quickly and inexpensively (in terms of computational overhead) detect when a data shift corruption event or a short read has occurred and to transparently retry the failed read operation. The method seeds the memory read buffer, into which read data will be written, by placing known values (a “seed pattern”) at the end of the buffer prior to initiating the read operation. If the seed pattern is still in the read buffer when the read operation completes, the read operation has encountered a data shift corruption event and should be retried. If the read operation completes correctly, the seed pattern will be overwritten by the data read from the disk. The particular seed pattern used and the size of the seed pattern are chosen to be discriminating (i.e., no false positives) and cheap to write and verify (i.e., no performance impact).

REFERENCES:
patent: 6092140 (2000-07-01), Tausheck
patent: 7284164 (2007-10-01), Yoshida
patent: 2004/0148543 (2004-07-01), Eto et al.
patent: 2005/0166084 (2005-07-01), Yagisawa et al.
patent: 2009/0106602 (2009-04-01), Piszczek et al.
patent: 2009/0125671 (2009-05-01), Flynn et al.

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