Schottky barrier gate type field effect transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Specified wide band gap semiconductor material other than... – Diamond or silicon carbide

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257280, 257472, 257509, 257744, H01L 2980, H01L 27095, H01L 2900, H01L 2348

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active

052296253

ABSTRACT:
The semiconductor device somprises a silicon substrate, a boron-doped high resistant silicon carbide layer formed on said silicon substrate and a silicon carbide layer formed on said high resistant silicon carbide layer.

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Chapter 9 from Semiconductors and Semimetals entitled "Silicon Carbide Junction Devices" by Albert C. Beer, vol. 7; pp. 625-683.
Articles from J. Appl. Phys. Oct. 15, 1986 entitled "Schottky-Barrier Field-Effect Transistors of 3C-SiC", Daimon et al., pp. 2989 to 2991.
"A New Doping Method Using Metalorganics in Chemical Vapor Deposition 6H-SiC" by S. Yoshida et al., Journal of Applied Physics 55 (1), Jan. 1, 1984 pp. 169-171.
"High Temperature Electrical Properties of 3C-SiC Epitaxial Layers Grown By Chemical Vapor Deposition" by K. Sasaki et al., Applied Physics Letters 45 (1) Jul. 1, 1984, pp. 72-73.

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