Optics: measuring and testing – Refraction testing – Schlieren effect
Patent
1987-10-16
1989-03-14
Evans, F. L.
Optics: measuring and testing
Refraction testing
Schlieren effect
G01N 2141
Patent
active
048120391
ABSTRACT:
A schlieren optical device using diode emitting monochromatic light as spot light source so as to have a compact and light-weight design, low calorific power, and low power consumption, and assure high reliability. In said optical device, imaging lens consists of a pair of lens groups arranged with an airspace reserved therebetween, knife edge consists of a light-shielding coating arranged on the surface of one of said lens groups and the other lens group is displaceable along the optical axis. Said optical device comprises a schlieren optical system and an optical system of a transmission type of microscope having optical axes perpendicularly intersecting with each other at the position of a sample, or a pair of schlieren optical systems and an optical system of a transmission type of microscope having optical axes perpendicularly intersecting with one another.
REFERENCES:
Burner et al, "Schlieren with a Laser Diode Source", Optical Engineering, Sep./Oct. 1981, vol. 20, No. 5, pp. 801-802.
Fujihara Tadafumi
Nagano Chikara
Shimada Yoshihiro
Tsukamoto Katsuo
Evans F. L.
Olympus Optical Co,. Ltd.
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