Chikara Nagano

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Centrifuge microscope capable of realizing polarized light obser

Optical: systems and elements – Compound lens system – Microscope
Patent

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Fine surface profile measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
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Illuminating device for microscopes

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Microscope objective lens system

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Microscope optical system

Optical: systems and elements – Compound lens system – With image recorder
Patent

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Profile ID: LFUS-PAI-P-259205

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