Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate
2007-06-12
2007-06-12
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
Position or displacement
Position transverse to viewing axis
C250S231130
Reexamination Certificate
active
10821518
ABSTRACT:
A scanning unit for a position measuring instrument for optical scanning of a measuring graduation. The scanning unit includes a light source that emits light in a direction towards a measuring graduation that generates modified light from the emitted light. A detector that receives the modified light. A lens array, disposed upstream of the detector and including a plurality of optical lenses, that generates a defined image of a region of the measuring graduation, scanned by the emitted light, on the detector, wherein an image magnification of the lens array is greater than 0 and less than or equal to 2.
REFERENCES:
patent: 4112295 (1978-09-01), Dubik et al.
patent: 4766307 (1988-08-01), Pelgrom et al.
patent: 5251012 (1993-10-01), Riegger et al.
patent: 5822125 (1998-10-01), Meyers
patent: 6437345 (2002-08-01), Bruno-Raimondi et al.
patent: 6449099 (2002-09-01), Fujimoto et al.
patent: 6603115 (2003-08-01), Gordon-Ingram
patent: 6963409 (2005-11-01), Benner et al.
patent: 2001/0024327 (2001-09-01), Fujimoto et al.
patent: 2004/0118758 (2004-06-01), Gordon-Ingram
patent: 2004/0227958 (2004-11-01), Benner et al.
patent: 2005/0168757 (2005-08-01), Benner et al.
patent: 197 55 565 (1998-06-01), None
patent: 100 22 619 (2001-12-01), None
patent: 0 470 420 (1992-02-01), None
patent: 1 099 936 (2001-05-01), None
patent: 2004-529344 (2004-09-01), None
patent: WO 02/084223 (2002-10-01), None
Anderson, R.H., “Close-up imaging of documents and displays with lens arrays,”Applied Optics,vol. 18, No. 4, Feb. 15, 1979, pp. 477-484.
Shaoulov, Vesselin, et al., “Compact Relay Lenses Using Microlenslet Arrays,”Proc. Of SPIE,vol. 4832, 2002, pp. 74-79.
Benner Ulrich
Holzapfel Wolfgang
Mayer Elmar
Dr. Johannes Heidenhain GmbH
Pham Hoa Q.
LandOfFree
Scanning unit for a position measuring instrument for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Scanning unit for a position measuring instrument for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning unit for a position measuring instrument for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3808496