Scanning thermal probe microscope

Details Scanning thermal probe microscope Scanning thermal probe microscope

2003-06-18

2008-11-11

Lefkowitz, Edward (Department: 2855)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

C374S043000, C374S032000, C374S163000, C702S133000, C702S136000, C702S130000

Reexamination Certificate

active

07448798

ABSTRACT:
An apparatus and method of measuring a parameter associated with a sample is provided. The method includes providing a probe adapted to heat the sample and applying a measuring current having a frequency ω1to the probe. In operation, the method measures the amplitude of the voltage across the probe at a frequency ω1. This amplitude is indicative of a temperature of the probe. The preferred embodiment also provides a method of separating contamination of the thermal data caused by the probe from thermal data associated with the sample under test.

REFERENCES:
patent: 4423967 (1984-01-01), Mouton
patent: 4747698 (1988-05-01), Wickramasinghe et al.
patent: 5003815 (1991-04-01), Martin et al.
patent: 5346306 (1994-09-01), Reading et al.
patent: 5441343 (1995-08-01), Pylkki et al.
patent: 5713667 (1998-02-01), Alvis et al.
patent: 5929438 (1999-07-01), Suzuki et al.
patent: 5969238 (1999-10-01), Fischer
patent: 6095679 (2000-08-01), Hammiche et al.
patent: 6200022 (2001-03-01), Hammiche et al.
patent: 6487515 (2002-11-01), Ghoshal
patent: 6652139 (2003-11-01), Cordes et al.
patent: 6692145 (2004-02-01), Gianchandani et al.
patent: 2002/0110177 (2002-08-01), Nakayama et al.
Williams et al., “Scanning thermal profiler”, Appl. Phys. Lett. 49 (23), Dec. 8, 1986, pp. 1587-1589.

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