Scanning surface microscope using a micro-balance device for hol

Details Scanning surface microscope using a micro-balance device for hol Scanning surface microscope using a micro-balance device for hol

1988-06-01

1989-11-28

Fields, Carolyn E.

Radiant energy

Inspection of solids or liquids by charged particles

250310, G01N 2300

Patent

active

048839590

ABSTRACT:
A scanning surface microscope is disclosed which includes a unit for moving a sample, and a micro-balance whose balance bar is provided with a probe-tip and an electrode at both ends thereof, to convert the irregularities of a sample surface facing the probe-tip into the displacement of the balance bar by utilizing a force generated between the probe-tip and the sample surface. The movement of the electrode indicative of the displacement of the balance bar is detected to obtain the topography of the sample surface.

REFERENCES:
patent: 4668865 (1987-05-01), Gimzewski et al.
patent: 4698502 (1987-10-01), Bednorz et al.
patent: 4724318 (1988-02-01), Binnig
patent: 4762996 (1988-08-01), Binnig et al.
patent: 4798989 (1989-01-01), Miyazaki et al.
patent: 4800274 (1989-01-01), Hansma et al.
patent: 4806755 (1989-02-01), Duerig et al.
patent: 4837435 (1989-06-01), Sakuhara et al.
Binnig et al, "Atomic Force Microscope", Physical Review Letters, vol. 56, No. 9, 3/3/86, pp. 930-933.

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