Scanning probe microscope with probe formed by single...

Details Scanning probe microscope with probe formed by single... Scanning probe microscope with probe formed by single...

2005-05-03

2005-05-03

Lee, John R. (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

C250S201300

Reexamination Certificate

active

06888135

ABSTRACT:
In a scanning probe microscope a probe associated with its sharp end includes a single conductive material.

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