Radiant energy – Inspection of solids or liquids by charged particles
Patent
1996-09-13
1998-02-03
Nguyen, Kiet T.
Radiant energy
Inspection of solids or liquids by charged particles
250307, 73105, H01J 3726
Patent
active
057147566
ABSTRACT:
An optical system for a scanning probe microscope provides both an optical on-axis view and an optical oblique view of the sample by two optical paths each providing an image to a CCD camera via an auto-zoom lens. A shutter alternately blocks the image of either view from reaching the auto-zoom lens. The CCD camera provides the optical image to a video display which also displays the scanning probe image, thus eliminating the need for eyepieces and allowing easy viewing of both the optical and scanning probe images simultaneously.
REFERENCES:
patent: 5260824 (1993-11-01), Okada et al.
patent: 5289004 (1994-02-01), Okada et al.
patent: 5360977 (1994-11-01), Onuki et al.
patent: 5394741 (1995-03-01), Kajimura et al.
patent: 5508517 (1996-04-01), Onuki et al.
patent: 5517027 (1996-05-01), Nakagawa et al.
Linker Frederick I.
Park Sang-il
Smith Ian R.
Nguyen Kiet T.
Park Scientific Instruments
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