Scanning probe microscope control system

Radiant energy – Inspection of solids or liquids by charged particles – Methods

Reexamination Certificate

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C250S306000, C977S850000

Reexamination Certificate

active

07435955

ABSTRACT:
A system for controlling the operation of a scanning probe microscope that greatly simplifies the microscope's operation is disclosed. The software design incorporates several advanced features such as a sample designator file, video tutorials, automation algorithms, and the ability to remotely load sample designator files and video tutorials.

REFERENCES:
patent: 4924091 (1990-05-01), Hansma et al.
patent: 5229606 (1993-07-01), Elings et al.
patent: 5253516 (1993-10-01), Elings et al.
patent: 5266801 (1993-11-01), Elings et al.
patent: RE34708 (1994-08-01), Hansma et al.
patent: 5336887 (1994-08-01), Yagi et al.
patent: 5415027 (1995-05-01), Elings et al.
patent: 5575660 (1996-11-01), Hooks
patent: 5652428 (1997-07-01), Nishioka et al.
patent: 5672816 (1997-09-01), Park et al.
patent: 5898176 (1999-04-01), Mori et al.
patent: 6255127 (2001-07-01), Fujino et al.
patent: RE37560 (2002-02-01), Elings
patent: 6781125 (2004-08-01), Tokuda et al.
patent: 6881954 (2005-04-01), Morimoto et al.
patent: 6912893 (2005-07-01), Minne et al.
patent: 6927391 (2005-08-01), Tokuda et al.
patent: 7041963 (2006-05-01), El Rifai et al.
patent: 2002/0050565 (2002-05-01), Tokuda et al.
patent: 2005/0001164 (2005-01-01), Tokuda et al.
patent: 2005/0199828 (2005-09-01), Tokuda et al.
patent: 2008/0017809 (2008-01-01), Hattori et al.

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