Scanning probe for data storage and microscopy

Details Scanning probe for data storage and microscopy Scanning probe for data storage and microscopy

2007-09-11

2007-09-11

Wells, Nikita (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

C250S309000, C073S105000

Reexamination Certificate

active

10502366

ABSTRACT:
A cantilever device for scanning a surface comprises a support, a tip platform and a flexible arm arrangement. The tip platform has a plurality of tips. These comprise at least two contact tips providing points of contact with a surface to be scanned, and a scanning tip for scanning the surface, where the scanning tip may be one of the two or more contact tips provided on the platform. The flexible arm arrangement connects the tip platform to the support and allows orientation of the platform, via flexing of the arm arrangement, to bring the contact tips into contact with a surface to be scanned. The platform is then at a well-defined orientation relative to the scan surface, and the scanning tip is appropriately positioned for the scanning operation. Scanning probe microscopes and data storage devices incorporating such cantilever devices are also provided.

REFERENCES:
patent: 6079255 (2000-06-01), Binnig et al.
patent: 2004/0218507 (2004-11-01), Binnig et al.

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