Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-08-29
1999-09-14
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
G01R 3126
Patent
active
059528370
ABSTRACT:
A sample to be measured having a semiconductor integrated circuit having interconnection lines is set on a scanning photoinduced current analyzer with one end of the interconnection line being open and the other end connected through a current amplifier to the ground. When a laser beam falls on part having a comparatively low thermal conductivity, such as a part having a void, of the interconnection line while the interconnection line is scanned with the laser beam, temperature distribution in the interconnection line changes at the part. The change in temperature distribution produces spontaneous thermoelectromotive force by the Seebeck effect to induce a current. The current amplifier amplifies the induced current, and then an image date converter converts the amplified current into image information in synchronism with the scanning operation of the laser beam. Since the photoinduced current can be measured without supplying a bias current to the sample to be measured, a current image corresponding to the photoinduced current can be formed to determine the position of a void even if the sample to be measured has a high resistance.
REFERENCES:
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patent: 5804980 (1998-09-01), Nikawa
"Microscopic Optical Beam Induced Current Measurements and their Applications", Koshi Haraguchi, 1994, IEEE, pp. 693-699. (unavailable month).
"Novel OBIC Observation Method for . . . ", Nikawa et al., The 19th International Symposium for Testing & Failure Analysis, Los Angeles, CA, U.S.A., Nov. 1993, p. 3.
"Tempreature Dependence of Optical Beam Reduced Current (OBREC) Signal in VLSI Metal Interconnection", Kawamura et al.
Extended Abstracts, The 55th Autumn Meeting, 1994, Japan Society of Applied Physics, pp. 49 and 586, published Sep. 19, 1994.
'94 Digital OBIC Scanner Seminar, pp. 23-33, published Nov. 9, 1994.
Mitsubishi Denki & Kabushiki Kaisha
Nguyen Vinh P.
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