Scanning electron microscope and method for dimension measuring

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type

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250307, H01J 3726

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active

055942458

ABSTRACT:
An electron beam, which can transmit through part of a specimen and can reach a portion that is not exposed to the electron beam, is irradiated, and a scanning image is obtained on the basis of a signal secondarily generated from a portion irradiated with the electron beam. Dimension-measuring start and end points are set on the scanning image and a dimension therebetween is measured. A three-dimensional model is assumed, the three-dimensional model is modified so as to match the scanning image, and dimension measurement is carried out on the basis of a modified three-dimensional model.

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