Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Patent
1994-12-20
1997-03-04
Anderson, Bruce C.
Radiant energy
Inspection of solids or liquids by charged particles
Electron probe type
H01J 37244
Patent
active
056082185
ABSTRACT:
A scanning electron microscope suitable for producing an image of high resolution by detecting secondary electrons and backscattered electrons generated from a specimen at a low accelerating voltage in a separate or synthesis fashion. In the scanning electron microscope electric and magnetic fields for separating trajectories of backscattered electrons and secondary electrons generated from a specimen are established, and a backscattered electron detector for detecting generated backscattered electrons is disposed on the trajectory of the backscattered electrons. According to the microscope, since secondary electrons and backscattered electrons can be detected efficiently in a separate fashion even at a low accelerating voltage of several kilovolts or less and besides the detector does not exert the deflection action on a primary electron beam, backscattered and secondary electron images of high resolution can be obtained.
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Ezumi Makoto
Fukuhara Satoru
Ose Yoichi
Sato Mitsugu
Todokoro Hideo
Anderson Bruce C.
Hitachi , Ltd.
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