Scanning electrochemical potential microscope

Details Scanning electrochemical potential microscope Scanning electrochemical potential microscope

2007-01-02

2007-01-02

Olsen, Kaj K. (Department: 1753)

Chemistry: electrical and wave energy

Apparatus

Electrolytic

C204S412000, C205S790500

Reexamination Certificate

active

10052921

ABSTRACT:
An apparatus and method of determining a potential at a surface of a sample in a polar liquid, for example, across an electrical double layer, includes the step of immersing the sample in a polar solution to form a potential gradient at the surface. A tip of a scanning probe microscope probe is then positioned in the solution generally adjacent the surface. During operation, the method includes measuring a potential of the probe. Relative scanning movement between the sample and the probe may be provided, and, in one mode of operation, a feedback signal is generated based on the measured potential. In that case, the tip may be moved generally orthogonal to the surface in response to the feedback signal to maintain a generally constant separation therebetween. The polar solution may have an associated ionic concentration, and the ionic concentration can be modified to tune the operation of the SEPM.

REFERENCES:
patent: 4668865 (1987-05-01), Gimzewski et al.
patent: 4871938 (1989-10-01), Elings et al.
patent: 4939363 (1990-07-01), Bando et al.
patent: 5202004 (1993-04-01), Kwak et al.
patent: 5497000 (1996-03-01), Tao et al.
patent: 5742172 (1998-04-01), Yasutake
patent: 5750989 (1998-05-01), Lindsay et al.
patent: 6005246 (1999-12-01), Kitamura et al.
patent: 6073485 (2000-06-01), Kitamura
patent: 6245204 (2001-06-01), Lindsay et al.
Horrocks et al, J. Chem. Soc., Faraday Trans., 1998, 94(8), pp. 1115-1118.
Wei et al, Anal. Chem.,Apr. 1995, 67(8), pp. 1346-1356.
Gyurcsanyi et al, Anal. Chem., May 2001, 73(9), pp. 2104-2111.
Denuault et al, Scanning Electrochemical Microscopy, 2001, pp. 397-444.
Wipf et al (J. Electrochem. Soc. vol. 138, 1991, pp. 469-474).

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