Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-01-09
2007-01-09
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C714S726000, C714S729000
Reexamination Certificate
active
10445832
ABSTRACT:
An intra-area connection order determining unit determines at random orders of connection of scan path circuits in each area divided by an placement area dividing unit. An inter-area connection order determining unit determines orders of connection of the scan path circuits between the areas such that length of interconnection between the areas divided by the placement area dividing unit becomes short. Accordingly, length of interconnection between the scan paths can be locally made short, reducing congestion of interconnections and generation of hold time errors.
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Kanaoka Toshihiro
Tanaka Genichi
Buchanan & Ingersoll & Rooney PC
Chiang Jack
Mitsubishi Electric Engineering Company Limited
Renesas Technology Corp.
Rossoshek Helen
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