Scan frame based test access mechanisms

Details Scan frame based test access mechanisms Scan frame based test access mechanisms

2007-03-30

2010-02-02

Puente, Emerson C (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S030000, C714S726000, C714S727000, C714S729000, C324S765010

Reexamination Certificate

active

07657790

ABSTRACT:
Testing of an electrical device is achieved by providing a test access mechanism within the device that can receive scan frames from an external tester. The received scan frames contain stimulus data to be applied to circuitry within the device to be tested, a command for enabling a test control operation, and a frame marker bit to indicate the end of the scan frame pattern. The inputting of scan frames can occur continuously and simultaneous with a commanded test control operation.

REFERENCES:
patent: 5526365 (1996-06-01), Whetsel
patent: 5606566 (1997-02-01), Whetsel
patent: 5831922 (1998-11-01), Choi
patent: 6389565 (2002-05-01), Ryan et al.
patent: 6769080 (2004-07-01), Whetsel

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