Scan diagnosis system and method

Details Scan diagnosis system and method Scan diagnosis system and method

2006-12-05

2006-12-05

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000

Reexamination Certificate

active

07146584

ABSTRACT:
A scan diagnosis system for testing and diagnosing a device-under-test is disclosed. The system includes a semiconductor tester adapted for coupling to the device-under-test and operative to generate pattern signals in the ATE domain to test the device-under-test and produce test output data in the ATE domain. An ATPG diagnosis tool is operative to generate ATPG pattern data and ATPG results data in the ATPG domain. A translator serves to effect automatic correlation of data between the ATPG domain and the ATE domain to allow data communication between the tester and the tool.

REFERENCES:
patent: 5845234 (1998-12-01), Testa et al.
patent: 5974248 (1999-10-01), Graef
patent: 6067652 (2000-05-01), Fusco et al.
patent: 6088712 (2000-07-01), Huang et al.
patent: 6134689 (2000-10-01), Mateja et al.
patent: 6185707 (2001-02-01), Smith et al.
patent: 6205407 (2001-03-01), Testa et al.
patent: 6212666 (2001-04-01), Gohl et al.
patent: 6266630 (2001-07-01), Garcia-Sabiro et al.
patent: 6453437 (2002-09-01), Kapur et al.
patent: 2002/0010560 (2002-01-01), Balachandran
patent: 2003/0093729 (2003-05-01), Suzuki et al.

Affiliated with

Also associated with

Rating

Scan diagnosis system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scan diagnosis system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scan diagnosis system and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3659933