Scan chain modification for reduced leakage

Details Scan chain modification for reduced leakage Scan chain modification for reduced leakage

2003-08-28

2009-08-04

Levin, Naum B (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C714S726000, C714S727000, C714S728000, C714S729000, C714S730000, C714S731000

Reexamination Certificate

active

07571402

ABSTRACT:
A leakage power control vector is loaded into existing test scan chain elements for application to circuit elements of a circuit in which the leakage currents are to be controlled. The vector is designed to configure the circuit elements into states in which leakage currents are reduced. A multiplexer selects the power control vector for loading into the scan chain elements, and a clock generator clocks the configuration vector into the scan chain elements. A sleep mode detector may be provided to configure the multiplexer to select the power control vector and to operate the clock generator to clock the power control vector into the scan chain elements when a sleep mode of the circuit is detected.

REFERENCES:
patent: 5912850 (1999-06-01), Wood et al.
patent: 5926487 (1999-07-01), Chappell et al.
patent: 6946903 (2005-09-01), Marshall et al.
patent: 7058834 (2006-06-01), Woods et al.
patent: 7188286 (2007-03-01), Dervisoglu et al.
patent: 7412637 (2008-08-01), Wang et al.
Abdollahi et al. “Leakage current reduction in sequential circuits by modifying the scan chains”, Fourth international symposium on Mar. 24-28, 2003.
De, Vivek et al., Techniques for Leakage Power Reduction, Design of High-Performance Microprocessor Circuits, IEEE Press, Chap. 3, pp. 46-62, 2001.
Aloul, Padi A., et al., “Robust SAT-Based Search Algorithm for Leakage Power Reduction”, International Workshop on Power and Timing Modeling, Optimization and Simulation, Seville, Spain, 2002.

Affiliated with

Also associated with

Rating

Scan chain modification for reduced leakage does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scan chain modification for reduced leakage, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scan chain modification for reduced leakage will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4057521