Scan based testing for analogue circuitry

Details Scan based testing for analogue circuitry Scan based testing for analogue circuitry

1995-06-07

1996-11-19

Ramirez, Ellis B.

Excavating

371 223, G06F 1520

Patent

active

055770525

ABSTRACT:
An integrated circuit containing analogue operation circuitry having a plurality of nodes for input and output of signals during normal operation, a plurality of scan cells connected to at least said plurality of nodes for containing signals to be utilized in selected tests to be performed on said analogue operation circuitry and responsive to selected output signals is provided. A method for testing a module of analogue circuitry incorporated into an integrated circuit having other circuitry by decoupling a plurality of module signal terminals from respective normal operation connections to a plurality of scan cells, and inputting at least portions of test suites and sensing test result output signals through at least selected ones of said scan cells is provided.

REFERENCES:
patent: 4602210 (1986-07-01), Fasang et al.
patent: 4907230 (1990-03-01), Heller et al.
patent: 4922492 (1990-05-01), Fasang et al.
patent: 5225834 (1993-07-01), Imai et al.
patent: 5404358 (1995-04-01), Russell
Jon Gabay, How Much Can Design-for-test Reduce the Need for Testing?, Sep. 1, 1990, Computer Design, v29, n17, p. 94(11).

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