Sample holder for mass analysis

Details Sample holder for mass analysis Sample holder for mass analysis

1984-11-30

1986-10-28

Anderson, Bruce C.

Radiant energy

Inspection of solids or liquids by charged particles

Analyte supports

250288, G01F 2100, G01F 2300

Patent

active

046201033

ABSTRACT:
A sample holder for mass analysis in which a sample to be irradiated by a fast particle beam is held for the measurement of secondary ions released from the sample. A matrix supporter for supporting and supplying a matrix is formed in a narrow space in a box provided in the sample holder.

REFERENCES:
patent: 4097738 (1978-06-01), Feve et al.
patent: 4178507 (1979-12-01), Brunnee et al.
patent: 4259572 (1981-03-01), Brunnee
patent: 4296322 (1981-10-01), Wechsung
patent: 4310759 (1982-01-01), Oechsner
patent: 4465935 (1984-08-01), von Criegern et al.

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