Sample and load scheme for observability of internal nodes in a

Electronic digital logic circuitry – Multifunctional or programmable – Array

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

326 16, 326 39, 371 222, H03K 19177, G01R 313177

Patent

active

057640793

ABSTRACT:
A programmable logic device (PLD) that provides the capability to observe and control the logic state of buried internal nodes is disclosed. The PLD provides shadow storage units for internal nodes such as logic element registers, memory cells, and I/O registers. A sample/load data path includes bidirectional data buses and shift register that facilitate the sampling of internal nodes for observing their logic states, and loading of internal nodes for controlling their logic states.

REFERENCES:
patent: 4864579 (1989-09-01), Kishida et al.
patent: 5260611 (1993-11-01), Cliff et al.
patent: 5497475 (1996-03-01), Alapat
patent: 5581198 (1996-12-01), Trimberger

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Sample and load scheme for observability of internal nodes in a does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sample and load scheme for observability of internal nodes in a , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sample and load scheme for observability of internal nodes in a will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2204638

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.