Runtime programmable BIST for testing a multi-port memory...

Details Runtime programmable BIST for testing a multi-port memory... Runtime programmable BIST for testing a multi-port memory...

2009-04-28

2011-10-18

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S719000, C714S720000, C714S733000, C714S736000, C365S201000

Reexamination Certificate

active

08042011

ABSTRACT:
One embodiment provides a runtime programmable system which comprises methods and apparatuses for testing a multi-port memory device to detect a multi-port memory fault, in addition to typical single-port memory faults that can be activated when accessing a single port of a memory device. More specifically, the system comprises a number of mechanisms which can be configured to activate and detect any realistic fault which affects the memory device when two simultaneous memory access operations are performed. During operation, the system can receive an instruction sequence, which implements a new test procedure for testing the memory device, while the memory device is being tested. Furthermore, the system can implement a built-in self-test (BIST) solution for testing any multi-port memory device, and can generate tests targeted to a specific memory design based in part on information from the instruction sequence.

REFERENCES:
patent: 5796745 (1998-08-01), Adams
patent: 5812469 (1998-09-01), Nadeau-Dostie
patent: 6070256 (2000-05-01), Wu
patent: 6216241 (2001-04-01), Fenstermaker et al.
patent: 6681358 (2004-01-01), Karimi et al.
patent: 7139204 (2006-11-01), Behera
patent: 7168005 (2007-01-01), Adams et al.
patent: 7716542 (2010-05-01), Chang et al.
Boutobza et al., Programmable Memeory BIST, 2005, IEEE, Paper45.2, pp. 1-10.

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