Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-07-08
2008-07-08
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
11017015
ABSTRACT:
A method to validate data used in a design of a semiconductor product. The method includes (a) reading resources of an application set defining the semiconductor product in a partially fabricated state comprising fabrication layers up to and including a lowest conductive layer (b) reading a user specification that (i) is developed based upon the application set at the partially fabricated state and (ii) establishes at least one upper conductive layer added to the application set that completes the design of the semiconductor product, (c) allocating a new resource from the user specification to the design of the semiconductor product, said new resource having multiple parameters, (d) validating the allocation of the new resource against the resources of the application set and (e) propagating the allocation of the new resource and the parameters throughout a description of the semiconductor product.
REFERENCES:
patent: 5128871 (1992-07-01), Schmitz
patent: 5452239 (1995-09-01), Dai et al.
patent: 5603043 (1997-02-01), Taylor et al.
patent: 5966707 (1999-10-01), Van Huben et al.
patent: 6216258 (2001-04-01), Mohan et al.
patent: 6243851 (2001-06-01), Hwang et al.
patent: 6260182 (2001-07-01), Mohan et al.
patent: 6292925 (2001-09-01), Dellinger et al.
patent: 6385757 (2002-05-01), Gupta et al.
patent: 6389379 (2002-05-01), Lin et al.
patent: 6408428 (2002-06-01), Schlansker et al.
patent: 6457164 (2002-09-01), Hwang et al.
patent: 6539520 (2003-03-01), Tiong et al.
patent: 6584601 (2003-06-01), Kodosky et al.
patent: 6675306 (2004-01-01), Baxter
patent: 6742165 (2004-05-01), Lev et al.
patent: 6789054 (2004-09-01), Makhlouf
patent: 6823497 (2004-11-01), Schubert et al.
patent: 6823502 (2004-11-01), Wingren et al.
patent: 6868534 (2005-03-01), Fattouh et al.
patent: 6901563 (2005-05-01), Ogami et al.
patent: 6909330 (2005-06-01), Colleran et al.
patent: 6910201 (2005-06-01), Byrn et al.
patent: 6938236 (2005-08-01), Park et al.
patent: 6964029 (2005-11-01), Poznanovic et al.
patent: 6988251 (2006-01-01), Vogel
patent: 7003423 (2006-02-01), Kabani et al.
patent: 7020852 (2006-03-01), Oeltjen et al.
patent: 7032190 (2006-04-01), Auracher et al.
patent: 7036106 (2006-04-01), Wang et al.
patent: 7039885 (2006-05-01), Mohan
patent: 7055113 (2006-05-01), Broberg et al.
patent: 7062736 (2006-06-01), Oleksinski et al.
patent: 7069523 (2006-06-01), Nation et al.
patent: 7080267 (2006-07-01), Gary et al.
patent: 7216312 (2007-05-01), Jain et al.
patent: 7240303 (2007-07-01), Schubert et al.
patent: 2003/0121010 (2003-06-01), Aubury
patent: 2004/0128626 (2004-07-01), Wingren et al.
patent: 2004/0261052 (2004-12-01), Perry et al.
patent: 2005/0080502 (2005-04-01), Chernyak et al.
patent: 2005/0114818 (2005-05-01), Khakzadi et al.
patent: 2005/0204316 (2005-09-01), Nebel et al.
patent: 2005/0223347 (2005-10-01), Okuaki
patent: 2005/0240892 (2005-10-01), Broberg et al.
patent: 2005/0273738 (2005-12-01), Byrn et al.
patent: 2005/0278670 (2005-12-01), Brooks et al.
patent: 2006/0178862 (2006-08-01), Chan et al.
Nordman John Emery
Senst Scott T.
Youngman Todd Jason
Chiang Jack
LSI Corporation
Maiorana PC Christopher P.
Rossoshek Helen
LandOfFree
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