Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2008-05-20
2008-05-20
Elms, Richard T. (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S233100, C365S156000
Reexamination Certificate
active
07376001
ABSTRACT:
A method for evaluating memory cell performance provides for circuit delay and performance measurements in an actual memory circuit environment. A ring oscillator implemented in a row of memory cells and having outputs connected to one or more bitlines along with other memory cells that are substantially identical to the ring oscillator cells is operated by the method. Logic may be included for providing a fully functional memory array, so that the cells other than the ring oscillator cells can be used for storage when the ring oscillator row wordlines are disabled. One or both power supply rails of individual cross-coupled inverter stages forming static memory cells used in the ring oscillator circuit may be isolated from each other in order to introduce a voltage asymmetry so that circuit asymmetry effects on delay can be evaluated.
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Chan Yuen H.
Devgan Anirudh
Joshi Rajiv V.
Ye Qiuyi
Elms Richard T.
Harris Andrew M.
International Business Machines - Corporation
Mitch Harris, LLC
Nguyen Dang
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