Routing of test signals of integrated circuits

Details Routing of test signals of integrated circuits Routing of test signals of integrated circuits

2006-09-26

2006-09-26

Thompson, A. M. (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C714S724000, C703S014000, C703S028000

Reexamination Certificate

active

07114135

ABSTRACT:
In an integrated circuit, test signals are routed from test points through a hierarchy of distributed multiplexers to output pads. The multiplexers are distributed locally to various regions that are arranged in a hierarchy of regional levels. Thus, each test signal is routed to the locally distributed multiplexer, and only a portion of the test signals reach the top-level multiplexer.

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