Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2007-03-20
2007-03-20
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By polarized light examination
Of surface reflection
Reexamination Certificate
active
10829620
ABSTRACT:
Disclosed are spectroscopic ellipsometer systems which include polarizer and analyzer elements which remain fixed in position during data acquisition, andat least one continuously rotating or step-wise rotatable compensator which transmits an electromagnetic beam therethrough and imposes a continuously variable or plurality of sequentially discrete polarization states on a beam of electromagnetic radiation; andat least one multiple element lens which also transmits the electromagnetic beam therethrough.
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Green Steven E.
Hale Jeffrey S.
He Ping
Herzinger Craig M.
Johs Blaine D.
Akanbi Isiaka O.
J.A. Woollam Co. Inc.
Toatley , Jr. Gregory J.
Welch James D.
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