Rotating contact element and methods of fabrication

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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C257SE21521

Reexamination Certificate

active

07851794

ABSTRACT:
Rotating contact elements and methods of fabrication are provided herein. In one embodiment, a rotating contact element includes a tip having a first side configured to contact a device to be tested and an opposing second side; and a plurality of deformed members extending from the second side of the tip and arranged about a central axis thereof, wherein the tip rotates substantially about the central axis upon compression of the plurality of deformed members.

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patent: 7385411 (2008-06-01), Eldridge
patent: 2002/0179904 (2002-12-01), Zhou et al.
patent: 2004/0121627 (2004-06-01), Grube et al.
International Search Report and Written Opinion mailed Oct. 14, 2008 for PCT Application No. PCT/US07/86667.

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