ROM embedded mask release number for built-in self-test

Details ROM embedded mask release number for built-in self-test ROM embedded mask release number for built-in self-test

1998-01-09

1999-09-28

Nelms, David

Static information storage and retrieval

Read/write circuit

Testing

G11C 700

Patent

active

059599120

ABSTRACT:
A read-only memory (ROM) embedded mask release number for a built-in self-test of a memory device is provided. A synchronous dynamic random access memory (10) comprises a conventional memory (12) and a built-in self-test arrangement (14). The built-in self-test arrangement (14) includes a read only memory (ROM) (72) which stores a plurality of algorithms. Each algorithm is comprised of a series of array access instructions (140) and program access instructions (142). The last instruction in ROM (72) is an idle instruction (120). Associated with idle instruction (120) is an identification number (132). Once stored in ROM (72), the identification number (132) can be read without the use of additional equipment.

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patent: 5787174 (1998-07-01), Tuttle
patent: 5818772 (1998-10-01), Kuge

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