Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-12-20
2005-12-20
Nguyen, VanThu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S189020
Reexamination Certificate
active
06977852
ABSTRACT:
A circuit to monitor the activity of a memory device during program/erase operations that are managed by a ROM-based microcontroller. Different signals can be monitored according to different test modes. The ROM-based microcontroller is triggered by a clock that can be connected to an internal fixed frequency oscillator or to an external clock source for which the frequency can be varied from 0 Hz to any frequency required by the application. The circuit outputs state machine status data, read only memory addresses, and memory status information in a series of multiplexing operations to provide a tester with the ability to determine the state of a memory device during various memory operations.
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Conenna Pasquale
De Santis Luca
Naso Giovanni
Pistilli Pasquale
Leffert Jay & Polglaze PA
Micro)n Technology, Inc.
Nguyen Van-Thu
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