Robust domino circuit design for high stress conditions

Electronic digital logic circuitry – Reliability

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326 95, 326 98, H03K 19003

Patent

active

060972076

ABSTRACT:
A domino circuit design for handling high stress conditions. The domino logic circuit includes a programmable mechanism for choosing whether the circuit is operating during normal operations or during a stress test, such as a burn-in procedure. In particular, the circuit includes a dual purpose transistor that is controllable by either a precharge signal or an output signal, and includes a mechanism for selecting whether the precharge signal or the output signal is to control the gate input of the dual purpose transistor. Accordingly, the dual purpose transistor will either act in parallel with the precharge device, or a keeper device depending on the mode of operation chosen.

REFERENCES:
patent: 4656417 (1987-04-01), Kirkpatrick et al.
patent: 5059828 (1991-10-01), Tanagawa
patent: 5572151 (1996-11-01), Hanawa et al.
patent: 6002292 (1999-11-01), Allen et al.

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