Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2007-12-25
2007-12-25
Nguyen, Tan T. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S185090, C365S189070, C365S201000, C235S380000, C235S492000
Reexamination Certificate
active
11298670
ABSTRACT:
A radio frequency identification (RFID) system and a method for correcting a failed cell using the same are provided. The RFID system effectively corrects randomly distributed cell data by using a failed cell correcting circuit in a memory. In the RFID system, a predetermined number of unit cells are separated into one memory group, and the same data are stored in each memory group at a write mode. At a read mode, the cell data of the selected memory group are compared, and the same data are identified as effective data to improve yield of the RFID system.
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Ahn Jin Hong
Kang Hee Bok
Hynix / Semiconductor Inc.
Nguyen Tan T.
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