RFID system including a memory for correcting a fail cell...

Static information storage and retrieval – Read/write circuit – Bad bit

Reexamination Certificate

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Details

C365S185090, C365S189070, C365S201000, C235S380000, C235S492000

Reexamination Certificate

active

11298670

ABSTRACT:
A radio frequency identification (RFID) system and a method for correcting a failed cell using the same are provided. The RFID system effectively corrects randomly distributed cell data by using a failed cell correcting circuit in a memory. In the RFID system, a predetermined number of unit cells are separated into one memory group, and the same data are stored in each memory group at a write mode. At a read mode, the cell data of the selected memory group are compared, and the same data are identified as effective data to improve yield of the RFID system.

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patent: 6362738 (2002-03-01), Vega
patent: 6563417 (2003-05-01), Shaw
patent: 6636998 (2003-10-01), Lee et al.
patent: 6674674 (2004-01-01), Poechmueller
patent: 2004/0124248 (2004-07-01), Selker
patent: 2005/0007252 (2005-01-01), Ameson et al.
patent: 2005/0134463 (2005-06-01), Yamazaki
patent: 2000-020334 (2000-01-01), None
patent: 2002-111514 (2002-04-01), None
patent: 2004-259426 (2004-09-01), None

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