Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2006-12-26
2006-12-26
Owens, Douglas W. (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S735000, C438S011000, C438S460000
Reexamination Certificate
active
07154116
ABSTRACT:
A rewiring substrate strip with a number of semiconductor component positions and semiconductor components, which are arranged in rows and columns on the rewiring substrate strip also includes are concealed contact lands arranged in sawing tracks between the semiconductor component positions. The concealed contact lands are connected by rewiring leads both to the external contacts of the product package and to contact areas of the semiconductor chips of the semiconductor components.
REFERENCES:
patent: 5334857 (1994-08-01), Mennitt et al.
patent: 6249052 (2001-06-01), Lin
patent: 2001/0042901 (2001-11-01), Maruyama
patent: WO 03/075344 (2003-09-01), None
Gibson Gavin
Ossimitz Peter
Edell Shapiro & Finnan LLC
Infineon - Technologies AG
Owens Douglas W.
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