Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-02-01
2010-11-23
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07840919
ABSTRACT:
The availability of device resources of an IC are quantified for a circuit design by building a representation of resource sites for the IC. Initial availability values are assigned to the resource sites, and any components having locking constraints are identified and placed into their respective sites. From the remaining resource sites, candidate sites for a component of the circuit design are identified. The candidate sites are summed, and the initial availability values of the candidate sites are modified according to the sum.
REFERENCES:
patent: 5798936 (1998-08-01), Cheng
patent: 6370673 (2002-04-01), Hill
patent: 6983439 (2006-01-01), Saunders et al.
patent: 7197734 (2007-03-01), Singh et al.
patent: 7290239 (2007-10-01), Singh et al.
patent: 7574685 (2009-08-01), Dong et al.
patent: 7669160 (2010-02-01), Furnish et al.
patent: 7752588 (2010-07-01), Bose
patent: 2007/0204252 (2007-08-01), Furnish et al.
patent: 2008/0216025 (2008-09-01), Furnish et al.
patent: 2008/0216039 (2008-09-01), Furnish et al.
patent: 2008/0216040 (2008-09-01), Furnish et al.
patent: 2009/0254874 (2009-10-01), Bose
Aggarwal Rajat
Ng Aaron
Wang Qiang
Cartier Lois D.
Hewett Scott
Kik Phallaka
Xilinx , Inc.
LandOfFree
Resource mapping of functional areas on an integrated circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Resource mapping of functional areas on an integrated circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Resource mapping of functional areas on an integrated circuit will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4188125