Patent
1988-11-01
1990-05-29
Edlow, Martin H.
357 16, 357 57, H01L 2712
Patent
active
049299840
ABSTRACT:
A resonant tunnelling barrier (RTB) structure device (e.g., diode), having a large peak-to-valley current density (Jp/Jv) ratio, includes an InP substrate and a RTB structure structure. The RTB structure is formed by a first doped layer of InP or In.sub.0.53 GA.sub.0.47 As, a first barrier layer of Al.sub.x Ga.sub.1-x As.sub.y Sb.sub.1-y (0.ltoreq.x.ltoreq.1, y=0.51+0.05x), a well layer of InP or In.sub.z Ga.sub.1-z As (0.52.ltoreq.z.ltoreq.0.54), a second barrier layer of the AlGaAsSb, and a second doped layer of InP or In.sub.z Ga.sub.1-z As. The layers of the RTB structure are lattice-matched to InP.
REFERENCES:
patent: 4712121 (1987-12-01), Yokoyama
Morkoc et al., Appl. Phys. Lett., 14 Jul. 1986 pp. 70-72.
Japanese Journal of Applied Physics, vol. 25, No. 12, Dec. 1986, pp. L983-L985, "Excellent Negative Differential Resistance of InAlAs/InGaAs Resonant Tunneling Barrier Structures Grown by MBE", by Tsuguo Inata et al.
Inata Tsuguo
Muto Shun-ichi
Sugiyama Yoshihiro
Takeuchi Atsushi
Edlow Martin H.
Fujitsu Limited
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