Patent
1987-08-04
1989-04-25
LaRoche, Eugene R.
357 16, 357 34, 357 61, H01L 2712, H01L 4500, H01L 29161, H01L 2972
Patent
active
048252646
ABSTRACT:
A resonant tunneling semiconductor device having a large peak-to-valley current density J.sub.p /J.sub.v ratio comprises an InP substrate, a first contact compound semiconductor lattice-matched to Inp, a first barrier layer of (In.sub.0.52 Al.sub.0.48 As).sub.z (In.sub.0.53 Ga.sub.0.47 As).sub.1-z, (0<z.ltoreq.1), a well layer of In.sub.1-y Ga.sub.y As, (0.48.gtoreq.y.gtoreq.0.46), a second barrier layer of (In.sub.0.52 Al.sub.0.48 As).sub.z -(In.sub.0.53 Ga.sub.0.47 As).sub.1-z, (0<z.ltoreq.1), and a second contact layer compound semiconductor lattice-matched to InP:The first and second barrier layers and the well layer forming a quantum-well structure.
Instead of the quantum-well structure above, it is possible to adopt the quantum-well structure of strained-layers comprising first and second barrier layers which are of In.sub.1-x Al.sub.x As (0.48<x.ltoreq.1) and have a thickness of 0.5 to 10.0 nm.
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Muto et al. "Quantum Well Width Dependence of Negative Differential Resistance of In0.52Al0.48As/In0.53Ga0.47As Resonant Tunneling Barriers Grown by MBE", Japanese Journal of Applied Physics, vol. 26, No. 3, Mar. 1987, pp. L220-L222.
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Fujii Toshio
Inata Tsuguo
Muto Shun-ichi
Fujitsu Limited
LaRoche Eugene R.
Shingleton Michael
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