Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2008-01-04
2011-10-11
Dickey, Thomas L (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257SE45003, C365S148000
Reexamination Certificate
active
08035095
ABSTRACT:
Provided is a resistive random access memory device that includes a storage node connected to a switching device. The resistive random access memory device includes a first electrode, a resistance variable layer, and a second electrode which are sequentially stacked, wherein a diffusion blocking layer is formed between the first electrode and the resistance variable layer or between the resistance variable layer or/and the second electrode.
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Lee Jung-hyun
Lee Myoung-jae
Dickey Thomas L
Erdem Fazli
Harness & Dickey & Pierce P.L.C.
Samsung Electronics Co,. Ltd.
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