Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-07-26
2011-07-26
Landau, Matthew C (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S467000, C257SE31029, C365S148000
Reexamination Certificate
active
07985961
ABSTRACT:
Example embodiments may provide resistive random access memory devices and/or methods of manufacturing resistive random access memory devices. Example embodiment resistive random access memory devices may include a switching device and/or a storage node connected to the switching device. The storage node may include a stack structure including a plurality of resistance change layers separated from one another and first and second electrodes each on a side wall of the stack structure. The resistance change layers may be connected to the first and the second electrodes in parallel and/or may have different switching voltages from each other.
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Choi Sang-jun
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Harness & Dickey & Pierce P.L.C.
Landau Matthew C
Nicely Joseph C
Samsung Electronics Co,. Ltd.
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