Resistive random access memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material

Reexamination Certificate

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Details

C257S467000, C257SE31029, C365S148000

Reexamination Certificate

active

07985961

ABSTRACT:
Example embodiments may provide resistive random access memory devices and/or methods of manufacturing resistive random access memory devices. Example embodiment resistive random access memory devices may include a switching device and/or a storage node connected to the switching device. The storage node may include a stack structure including a plurality of resistance change layers separated from one another and first and second electrodes each on a side wall of the stack structure. The resistance change layers may be connected to the first and the second electrodes in parallel and/or may have different switching voltages from each other.

REFERENCES:
patent: 6992369 (2006-01-01), Kostylev et al.
patent: 7635855 (2009-12-01), Chen et al.
patent: 2005/0174861 (2005-08-01), Kim et al.
patent: 2005/0250281 (2005-11-01), Ufert et al.
patent: 2006/0077706 (2006-04-01), Li et al.
patent: 2006/0284214 (2006-12-01), Chen
patent: 2008/0023685 (2008-01-01), Czubatyj et al.
patent: 2008/0135824 (2008-06-01), Lai et al.
patent: 2010/0187492 (2010-07-01), Lee

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