Resist polymer and resist composition

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S910000, C430S326000, C526S297000, C526S298000, C526S281000, C526S282000, C526S270000

Reexamination Certificate

active

07575846

ABSTRACT:
The resist polymer of the present invention comprises a specific constitutional unit having a cyano group, a constitutional unit having an acid-dissociable group, and a specific constitutional unit having a lactone skeleton. When the above polymer is used as a resist resin in DUV excimer laser lithography or electron beam lithography, it exhibits high sensitivity and high resolution, and provides a good resist pattern shape, having a small degree of occurrence of line edge roughness or generation of microgels.

REFERENCES:
patent: 5155188 (1992-10-01), Goodall
patent: 5509959 (1996-04-01), Nielsen et al.
patent: 5843624 (1998-12-01), Houlihan et al.
patent: 6165678 (2000-12-01), Allen
patent: 6207779 (2001-03-01), Chang et al.
patent: 2004/0146802 (2004-07-01), Yamamoto et al.
patent: 2006/0127801 (2006-06-01), Momose et al.
patent: 01-092206 (1989-04-01), None
patent: 01-100145 (1989-04-01), None
patent: 02-189313 (1990-07-01), None
patent: 02-193958 (1990-07-01), None
patent: 02-211401 (1990-08-01), None
patent: 02-216632 (1990-08-01), None
patent: 04-251259 (1992-09-01), None
patent: 05-249682 (1993-09-01), None
patent: 07-049569 (1995-02-01), None
patent: 09-211866 (1997-08-01), None
patent: 10-274852 (1998-10-01), None
patent: 10-307388 (1998-11-01), None
patent: 10-319595 (1998-12-01), None
patent: 11-130845 (1999-05-01), None
patent: 11-352694 (1999-12-01), None
patent: 2000-258915 (2000-09-01), None
patent: 2001-264982 (2001-09-01), None
patent: 2002-049156 (2002-02-01), None
patent: 2002-202605 (2002-07-01), None
patent: 2002-244295 (2002-08-01), None
patent: 2002-268222 (2002-09-01), None
patent: 2002-275215 (2002-09-01), None
patent: 2003-122007 (2003-04-01), None
patent: 2003-233188 (2003-08-01), None
patent: 99/50322 (1999-10-01), None
Derwent English abstract for JP2002-202605.
Derwent English abstract for JP2003-122007.
U.S. Appl. No. 11/596,865, filed Nov. 17, 2006, Ootake et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Resist polymer and resist composition does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Resist polymer and resist composition, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Resist polymer and resist composition will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4094671

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.