Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2004-01-29
2009-08-18
Lee, Sin J. (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S910000, C430S326000, C526S297000, C526S298000, C526S281000, C526S282000, C526S270000
Reexamination Certificate
active
07575846
ABSTRACT:
The resist polymer of the present invention comprises a specific constitutional unit having a cyano group, a constitutional unit having an acid-dissociable group, and a specific constitutional unit having a lactone skeleton. When the above polymer is used as a resist resin in DUV excimer laser lithography or electron beam lithography, it exhibits high sensitivity and high resolution, and provides a good resist pattern shape, having a small degree of occurrence of line edge roughness or generation of microgels.
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U.S. Appl. No. 11/596,865, filed Nov. 17, 2006, Ootake et al.
Fujiwara Tadayuki
Hayashi Ryotaro
Iwai Takeshi
Momose Hikaru
Ootake Atsushi
Lee Sin J.
Mitsubishi Rayon Co. Ltd.
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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