Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Patent
1980-09-22
1982-08-24
Newsome, John H.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
427 431, B05D 306
Patent
active
043461638
ABSTRACT:
1. A resist for use in forming a positive pattern with a radiation comprising a copolymer composed of methyl methacrylate and methacrylic acid and a cross-linking agent having the following general formula: ##STR1## wherein R is H or CH.sub.3, x is an integer of 1 to 9, and y and z are zero, or an integer of 1 to 3.
2. A process for forming a positive pattern on a substrate with a radiation.
REFERENCES:
patent: 3914462 (1975-10-01), Morishita et al.
patent: 3943187 (1976-03-01), Wu
patent: 3981985 (1976-09-01), Roberts
patent: 3984582 (1976-10-01), Feder et al.
patent: 4087569 (1978-05-01), Hatzakis
Hibino Kunio
Morimoto Takayoshi
Takeyama Kenichi
Matsushita Electric - Industrial Co., Ltd.
Newsome John H.
LandOfFree
Resist for use in forming a positive pattern with a radiation an does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Resist for use in forming a positive pattern with a radiation an, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Resist for use in forming a positive pattern with a radiation an will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1437298