Resist composition for deep ultraviolet light

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

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430170, 430512, 430905, 430926, 430927, G03C 152, G03F 7039

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056959109

ABSTRACT:
A resist composition for deep ultraviolet light comprising (a) one of the following resin components (i)-(iii): (i) a resin which becomes alkali-soluble by eliminating protective groups by the action of an acid, (ii) a combination of an alkali-soluble resin and a dissolution-inhibiting compound, and (iii) a combination of an alkali-soluble resin and a crosslinkable compound, (b) an acid generater, (c) a special anthracene derivative, and (d) a solvent, is suitable for forming a pattern using deep ultraviolet light, KrF excimer laser light, etc., on a highly reflective substrate having level differences due to absorption of undesirable reflected deep ultraviolet light.

REFERENCES:
patent: 5059512 (1991-10-01), Babich et al.
patent: 5250395 (1993-10-01), Allen et al.
patent: 5272042 (1993-12-01), Allen et al.
patent: 5376498 (1994-12-01), Kajita et al.
Chemical Abstract, vol. 105; 25881n, 1986.

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