Resist composition

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S905000, C430S907000

Reexamination Certificate

active

06916590

ABSTRACT:
The following resist composition which is excellent particularly in transparency to light beams and dry etching properties and gives a resist pattern excellent in sensitivity, resolution, evenness, heat resistance, etc., as a chemical amplification type resist, is presented. A resist composition which comprises a fluoropolymer (A) having repeating units represented by a structure formed by the cyclopolymerization of one molecule of a fluorinated diene and one molecule of a monoene, in which the monoene unit in each repeating unit has a blocked acid group capable of regenerating the acid group by the action of an acid, an acid-generating compound (B) which generates an acid upon irradiation with light, and an organic solvent (C).

REFERENCES:
patent: 6468712 (2002-10-01), Fedynyshyn
patent: 6815146 (2004-11-01), Okada et al.
patent: 2002/0051940 (2002-05-01), Lee et al.
patent: 2002/0146638 (2002-10-01), Ito et al.
patent: 2002/0146639 (2002-10-01), Brock et al.
patent: 2003/0027077 (2003-02-01), Zampini et al.
patent: 63-238115 (1988-10-01), None
patent: 2001-133979 (2001-05-01), None
patent: 2001-154362 (2001-06-01), None
patent: WO 00/17712 (2000-03-01), None
patent: WO 00/67072 (2000-11-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Resist composition does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Resist composition, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Resist composition will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3427211

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.