Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate
2005-03-15
2005-03-15
Nguyen, Tu T. (Department: 2877)
Optics: measuring and testing
For optical fiber or waveguide inspection
Reexamination Certificate
active
06867853
ABSTRACT:
Disclosed is a residual stress measuring system for measuring the residual stress in an optical fiber. The residual stress measuring system comprises a light source for generating light used to measure the residual stress, a lens system for converting the generated light into a plane wave, a polarimeter for transforming the converted light to an input polarized light, which is incident on the optical fiber, a rotational measuring section for rotating the optical fiber so as to enable the polarized light to transmit through the optical fiber in various directions, and a detector for detecting the residual stress from a phase shift of the transmitted light.
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patent: 6373564 (2002-04-01), Park et al.
patent: 20010022873 (2001-09-01), Kim et al.
“Photoelastic Computer Tomography: A Novel Measurement Method for Axial Residual Stress Profile in Optical Fibers;” Tetsuji Abe et al.; Optical Society of America; vol. 3, No. 1, Jan. 1986; 6 pages.
Kim Hyeon-cheol
Park Yong-Woo
Ro Sung-In
Cha & Reiter L.L.C.
Nguyen Tu T.
Samsung Electronics Co,. Ltd.
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