Gas separation: processes – With recording or signaling condition
Reexamination Certificate
2005-02-22
2005-02-22
Pham, Minh-Chau T. (Department: 1724)
Gas separation: processes
With recording or signaling condition
C095S090000, C096S108000, C096S417000
Reexamination Certificate
active
06858062
ABSTRACT:
A residual gas removing device for a gas supply apparatus in a semiconductor fabricating facility, includes a low stress valve disposed between a mass flow controller and a chamber. The low stress valve alternately supplies or cuts off a gas from the mass flow controller to the chamber. A WF6 gas removing apparatus is in flow communication with a gas inlet line of the low stress valve to remove a residual WF6 gas in the gas inlet line, before proceeding with a subsequent deposition step.
REFERENCES:
patent: 4561865 (1985-12-01), McCombs et al.
patent: 4857086 (1989-08-01), Kawai
patent: 5238469 (1993-08-01), Briesacher et al.
patent: RE34434 (1993-11-01), Campbell et al.
patent: 5334237 (1994-08-01), Lorimer
patent: 6068685 (2000-05-01), Lorimer et al.
patent: 6168645 (2001-01-01), Succi et al.
patent: 6196050 (2001-03-01), Ikeda et al.
patent: 6514313 (2003-02-01), Spiegelman et al.
patent: 6536460 (2003-03-01), Yelverton et al.
Cho Chan-Hyung
Choi Chul-Hwan
Jeon Jin-Ho
Kim Kyung-Tae
Kim Yong-Gab
Pham Minh-Chau T.
Volentine Francos & Whitt PLLC
LandOfFree
Residual gas removing device and method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Residual gas removing device and method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Residual gas removing device and method thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3463653