Replacing single-cut via into multi-cut via in semiconductor...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C716S030000, C716S030000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

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07634751

ABSTRACT:
According an aspect of the invention, there is provided a design support system of a semiconductor integrated circuit includes: a first unit configured to determine a wiring path by calculating wiring resource consuming information for carrying out a connection through a multi-cut via in case that the connection is carried out through the multi-cut via in a wiring region having a plurality of layers; and a second unit configured to replacing a single-cut via into the multi-cut via.

REFERENCES:
patent: 5638292 (1997-06-01), Ueda
patent: 5984510 (1999-11-01), Guruswamy et al.
patent: 6078737 (2000-06-01), Suzuki
patent: 6536023 (2003-03-01), Mohan et al.
patent: 6637013 (2003-10-01), Li
patent: 7272810 (2007-09-01), Orita
patent: 7340711 (2008-03-01), Hetzel et al.
patent: 2005/0280159 (2005-12-01), Okumura
patent: 2006/0048088 (2006-03-01), Nakano
patent: 2006/0080576 (2006-04-01), Hirano
patent: 2006/0090144 (2006-04-01), Lakshmanan et al.
patent: 2007/0101307 (2007-05-01), Ueda
patent: 11-265940 (1999-09-01), None

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