Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Reexamination Certificate
2006-08-15
2006-08-15
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
Insulated gate formation
C438S182000, C438S183000, C257SE29158, C257SE21441
Reexamination Certificate
active
07091118
ABSTRACT:
A semiconductor device with a replacement metal gate and the process for making the same removes a dummy gate from a semiconductor device. Within the recess left by the dummy gate is a silicon layer on a gate dielectric layer. A replacement metal is deposited on the thin silicon layer and then reacted with the silicon layer to form a metal-rich silicon layer on the gate dielectric layer.
REFERENCES:
patent: 4563805 (1986-01-01), Scovell et al.
patent: 4670970 (1987-06-01), Bajor
patent: 5756394 (1998-05-01), Manning
patent: 5830775 (1998-11-01), Maa et al.
patent: 6096642 (2000-08-01), Wu
patent: 6261935 (2001-07-01), See et al.
patent: 6297107 (2001-10-01), Paton et al.
patent: 6537613 (2003-03-01), Senzaki et al.
patent: 6579784 (2003-06-01), Huang
patent: 6607958 (2003-08-01), Suguro
Black Linda R.
Chudzik Michael
Jammy Rajarao
Pan James
Pellerin John
Advanced Micro Devices , Inc.
International Business Machines
Lebentritt Michael
Pompey Ron
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