Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2008-11-21
2009-11-17
Nguyen, Dang T (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S230080, C365S185220
Reexamination Certificate
active
07619938
ABSTRACT:
A repairing fully-buffered memory module can have memory chips with some defects such as single-bit errors. A repair controller is added to the Advanced Memory Buffer (AMB) on the memory module. The AMB fully buffers memory requests that are sent as serial packets over southbound lanes from a host. Memory-access addresses are extracted from the serial packets by the AMB. The repair controller compares the memory-access addresses to repair addresses and diverts access from defective memory chips to a spare memory for the repair addresses. The repair addresses can be located during testing of the memory module and programmed into a repair address buffer on the AMB. The repair addresses could be first programmed into a serial-presence-detect electrically-erasable programmable read-only memory (SPD-EEPROM) on the memory module, and then copied to the repair address buffer on the AMB during power-up.
REFERENCES:
patent: 2007/0058471 (2007-03-01), Rajan et al.
patent: 2007/0121389 (2007-05-01), Wu et al.
Co Ramon S.
Sun David
Auvinen Stuart T.
g Patent LLC
Kingston Technology Corp.
Nguyen Dang T
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